JEOL supplies a range of powerful x-ray microanalysis solutions in the fields of energy dispersive (EDX), wavelength dispersive (WDX) and light element (SXES) analytics. Not only is SXES analysis capable of precisely detecting very light elements and trace element analysis, it can also examine bonding states (chemical shift).
Thanks to their compact structure and ease of operation, JEOL x-ray fluorescence systems can be used in all areas of modern analytics, from pollutant analysis and RoHS inspection to layer thickness measurement. JEOL customises analytics solutions that enable even less experienced operators to use the system for a multitude of demanding problems.
As a mass-produced product, it is possible to manufacture paper cost effectively if the ratio of fibres and filler material is optimised without the changing the mechanical and printing properties. In this respect it is important to examine the distribution of fibre and filler material in the paper both during the paper development and production. The exceptionally robust analytic systems from JEOL can be used during challenging routine operation for artifact-free preparation, as well as for the precise morphological and chemical characterisation of cellulose.
Facing cut through a sheet of paper
Source data: JEOL (Germany) GmbH
Asbestos was used for decades as a fire- and temperature-proof raw and insulation material. Once the health risks were discovered, many laboratories examined potentially asbestos-containing construction materials. JEOL is the only manufacturer to offer the powerful combination of its own electron microscopes and own spectrometers as a complete solution for standards-compliant asbestos analysis.
Identification of a chrysotile fibre by means of SEM imaging and EDX spectrum
Bildquelle: JED-Broschüre
Li batteries are used in mobile phones or vehicles, among other things. Thanks to the newly developed light element spectrometer from JEOL, detecting in a microscope has for the first time become routine and standard with high spatial resolution and detection sensitivity.
Identification of lithium in an Li-ion battery
Source data: JEOL Ltd., SXES brochure
The formation of precipitates is used systematically to define the mechanical properties of a metallic structure. However, as a form of contamination, these can also be undesired. In order to be able to judge the quality of an alloy, it is necessary to determine the morphology and chemical composition of the precipitates. This is why JEOL supplies all-round, complete solutions, from artifact-free sample preparation to high-resolution analysis from the µm to the nm level.
Element mapping image of a brass alloy
Source data: JEOL (Germany) GmbH
Fibres are used in many branches of industry, e.g. in textile processing or as a structural material in mechanical engineering. Their structural properties can be studied by means of a fibre cross-section, for example. JEOL supplies an established and powerful complete solution for simple, artifact-free preparation and high-resolution imaging and analytics.
SEM image of a cross-section through a fibre bundle
Source data: JEOL Ltd., Ion Slicer brochure
During operation, materials are frequently exposed to high thermal loads, which change the microstructure or chemical composition of the material. In order to be able to examine this change in a scanning electron microscope, JEOL equips its EDX detectors with the option of recording the change over time. It is therefore possible to observe in-situ e.g. the grain growth and chemical separation caused by an external heat input.
Thermally induced change to soldering tin (Pb Sn)
Source: JEOL Ltd.
The detection of rare earths is not only of interest for mineralogical samples, it is also becoming increasingly significant due to the continuous development of high-performance microelectronics. For decades, JEOL has been setting the bar for detecting the mostly low-concentrated elements with its energetically and spatially high-resolution trace element analytics.
Rare earths as an example of trace element analysis
Source data: JEOL (Germany) GmbH, Demoreport Uni. Vienna (JXA)
Minerals are frequently complex structures formed from a multitude of elements. Element mapping images are one of the most important methods for achieving the spatially resolved visualisation of the chemical composition. These mapping images can be used to gather essential information on e.g. the creation and structure of the samples under examination. For this task, JEOL supplies the most stable and most energetically and spatially high-resolution spectroscopy systems.
Element mapping images of a symplectite microsection
Source data: JEOL (Germany) GmbH, Demoreport Uni. Vienna (JXA)
For functionalised high-performance materials, the need for the controlled application of multi-layer systems on a substrate is becoming increasingly important. Specifically in the context of protective layers on metallic substrates, these systems make an important contribution to improving the longevity of heavily stressed components. In order to be able to image the chemical composition and the microstructural properties, JEOL has developed instruments that make it possible to prepare multi-layered components and map them to a previously unavailable depth of detail.
Layers of paint on an Al substrate
Source: JEOL (Germany) GmbH