Second-hand Equipment

Second-hand Equipment

A selection of JEOL second-hand equipment is listed below.
Please contact us if you have questions about specific instruments or prices.

JSM-IT200 InTouchScope™

Versatile, high throughput SEM from JEOL combined with the intuitive operation of a table-top SEM. Fully functional setup from our applications laboratory.


The InTouchScope JSM-IT200 features all the capabilities of a full size tungsten SEM with integrated EDS analysis in a small, ergonomic and intuitive design. It is very easy to install since neither cooling water nor gas is necessary.

Practical features for users of all levels:

  • high resolution imaging in HV/LV/SE/BSE
  • Zeromag-mode for intuitive transition from light-optic to SEM image
  • chemical analysis with optional integrated EDS and live analysis
  • multi-touch screen control and wireless operation
  • automatic SEM condition setup based on sample type
  • simultaneous multiple live image and movie capture
  • fast sample navigation at 5x – 300,000x magnifications
  • Smile View Premium with image sharpening, montaging, position alignment and overlay
  • Compact floor space: ca. 0,5m²
JSM-IT200 InTouchScope™
JSM-IT200 InTouchScope™

JSM-IT700 InTouchScope™

Built off of the highly successful predecessor of our InTouchScope™ series SEMs, the JSM-IT700HR was developed to meet increasing demands in the market place. This new SEM breaks through the conventional general-purpose SEM in terms of high resolution imaging and high spatial-resolution analysis, by incorporating a new high-brightness electron gun.


We proudly introduce a new addition to our JEOL InTouchScope™ series SEMs, the JSM-IT700HR.
Increase your productivity with our fully-integrated software, from specimen navigation to analysis to report creation.

This state-of-the-art SEM, with its high-brightness electron gun system, provides amazing high-resolution imaging along with high sensitivity and high spatial resolution analysis at even faster speeds.

  • "Zeromag" function links holder graphics, CCD and SEM images to simplify sample navigation.
  • "Live Analysis", our embedded EDS system, shows real time EDS spectra during image observation for efficient elemental analysis.
  • SMILE VIEW™ Lab, enabling integrated management of image and analysis data, facilitates report generation for all data "Specimen Exchange Navi" enables safe and simple specimen exchange.
  • With the newly-developed Auto Beam Alignment function, the electron optical conditions are always kept optimum.
  • Large specimen stage which accommodates various sizes and types of specimens for extended observation and analysis.
  • Compact design with small footprint.
JSM-IT700 InTouchScope™
JSM-IT700 InTouchScope™

JCM-7000 Table-top Scanning Electron Microscope

Innovative desktop scanning electron microscope with a fully hard- and software-integrated energy-dispersive X-ray spectrometer (EDS) including a low-vacuum mode for non-conductive samples. Fully functional setup from our applications laboratory.


  • “Live 3D”: real-time SEM image and reconstructed 3D surface for simultaneous acquisition of topographic depth information and surface fine structures.
  • Full-featured electron optics for magnifications up to x100,000.
  • Straightforward emitter change provided by pre-centered tungsten filaments.
  • Automatic condition setting based on sample type and application ensures high quality results and enhances productivity.
  • JEOL ZeroMag for seamless transition between light optical and SEM imaging dramatically improves handling and through-put.
  • Fully integrated JEOL EDS system including live EDS for maximum ease of use and comprehensive report generation.
  • Automated acquisition of SEM images and elemental distribution maps resulting in high resolution montages.
  • Challenging samples can be investigated in low-vacuum mode with the push of a button.
  • Large chamber for samples of up to 80 mm diameter and 50 mm height.
  • Simple installation – an electric socket and you are ready to go!
  • Compact design for mobile applications.
JCM-7000 Table-top Scanning Electron Microscope
JCM-7000 Table-top Scanning Electron Microscope


Easy-to-operate preparation system for the production of specimen cross-sections for SEM, EPMA and auger applications.
JEOL Cross section polisher IB-19530CP from our applications laboratory


Improvements to facilitate fast and easy processing of a wide range of materials include:

  • High throughput: high-speed ion source and auto start function
  • Auto processing programs: High-speed processing and finishing, intermittent processing
  • Ease of setup: through modularized function holder
  • Multi-purpose stage for planar surface milling and polishing and ion beam sputter coating
  • Highly-durable shield

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