Focused Ion Beam Systems
Focused Ion Beam Systems
Focused Ion Beam Systems

Range of application

As with the JEOL high-resolution scanning electron microscopes, the FIB systems also never compromise between maximum resolution and analytics. From defect analysis in the semiconductor industry to lamella preparation for transmission electron microscopy and the 3D reconstruction of biological samples under cryogenic conditions – the robust FIB systems from JEOL will support you with all preparatory and analytical matters.


  • Ultra-fast analytics and reconstruction by high electron and ion beams
  • Precise, reliable 3D analytics with EDS and EBSD without sample rotation
  • Convenient transfer solutions to JEOL electron microscopes
  • Integrated solutions for correlative microscopy

Detailed solutions

Contact Form

We are happy to answer your questions at no charge and free of obligation and can offer consulting on upcoming projects. Please use the following contact form (* = mandatory field) for your questions.

Choose Contact type*

Your Contact details*

News from JEOL

Message to JEOL

Disclosure of personal data to third parties

This website uses services that collect personal data in order to provide social media features and to analyse our traffic. These services include Google Maps (for the display of our location) and Google Analytics (for local website analysis). These integrated services might merge the personal data with further data. Further information on the used cookies and withdrawal can be found in our data privacy statement.
Your consent is voluntary, not necessary for using the website and can be withdrawn anytime.
You can accept or decline the transfer and processing of data by the following services.

I have read and understood the notes on privacy. I agree to the transfer and storage of my data according to the data privacy statement. I know that I have the right to withdraw this consent at any time without giving any reason, without affecting the lawfulness of the data processed after my consent and until withdrawal.