Electron Beam Microprobes Analyzers
Electron Beam Microprobes Analyzers
Electron Beam Microprobes Analyzers

Range of application

Thanks to their combination of high-resolution electron optics and wavelength dispersive x-ray spectroscopy, JEOL electron probe microanalyzers deliver a highly sensitive, spatially resolved (trace) element analysis with very high reproducibility.

Solutions

  • Flexible electron sources (W, LaB6 or FEG)
  • Records large-scale element mapping images (mapping)
  • Very high sensitivity and energy resolution
  • Combined recording of EDX, WDX and SXES spectra
  • Light element analytics from lithium
  • Simple and intuitive operation

Detailed solutions

  • Characterising lithium batteries

    Characterising lithium batteries

    Li batteries are used in mobile phones or vehicles, among other things. Thanks to the newly developed light element spectrometer from JEOL, detecting in a microscope has for the first time become routine and standard with high spatial resolution and detection sensitivity.

    Product groups

    Solutions

    Identification of lithium in an Li-ion battery
    Identification of lithium in an Li-ion battery

    Identification of lithium in an Li-ion battery

    Source data: JEOL Ltd., SXES brochure

  • Microscale trace element analysis

    Microscale trace element analysis

    The detection of rare earths is not only of interest for mineralogical samples, it is also becoming increasingly significant due to the continuous development of high-performance microelectronics. For decades, JEOL has been setting the bar for detecting the mostly low-concentrated elements with its energetically and spatially high-resolution trace element analytics.

    Product groups

    Solutions

    Rare earths as an example of trace element analysis
    Rare earths as an example of trace element analysis

    Rare earths as an example of trace element analysis

    Source data: JEOL (Germany) GmbH, Demoreport Uni. Vienna (JXA)

  • Mineral microstructures

    Mineral microstructures

    Minerals are frequently complex structures formed from a multitude of elements. Element mapping images are one of the most important methods for achieving the spatially resolved visualisation of the chemical composition. These mapping images can be used to gather essential information on e.g. the creation and structure of the samples under examination. For this task, JEOL supplies the most stable and most energetically and spatially high-resolution spectroscopy systems.

    Product groups

    Solutions

    Element mapping images of a symplectite microsection
    Element mapping images of a symplectite microsection

    Element mapping images of a symplectite microsection

    Source data: JEOL (Germany) GmbH, Demoreport Uni. Vienna (JXA)

  • Rock analysis

    Rock analysis

    High-resolution element maps are of central significance for understanding geological processes. Over many decades, JEOL electron probe microanalyzers have proven to be the perfect tool for the reliable, automated examination of diffusion profiles and the spatial distribution of trace elements. Our detection threshold for this non-destructive method is less than 20 ppm.

    Product groups

    • Electron Beam Microprobes Analyzers

    Solutions

    Element mapping images of a rock sample
    Element mapping images of a rock sample

    Element mapping images of a rock sample

    Source data: JEOL (Germany) GmbH, Geoforschungszentrum Potsdam

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