20.03.2026

JEOL will showcase the latest developments in electron microscopy and invites visitors to experience live demonstrations of the JSM-IT210.
JEOL will once again be present at analytica and invites visitors to learn more about the latest developments in electron microscopy. At our booth we will showcase the scanning electron microscope JEOL JSM-IT210, where live demonstrations will take place regularly throughout the exhibition. Visitors are also welcome to bring their own samples for on-site analysis. Our application specialists will demonstrate how modern SEM technology can deliver fast and reliable results for a wide range of analytical tasks.
We also welcome international distribution partners and potential new distributors who would like to learn more about the JEOL portfolio. In addition to our local team, product management, application experts and colleagues from the JEOL headquarters in Japan will also be available for technical discussions.
We are happy to provide guest tickets for analytica upon request and look forward to welcoming you at our booth.