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JEOL (Germany) GmbH
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D-85386 Eching b. München
Germany
Phone: +49 (0)8165 77-346
Fax: +49 (0)8165 77-512
E-mail: info@jeol.de
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08.05.2013 Mixcroscopy - a new correlative microscope system, that combines optical microscopy and scanning electron microscopy
JEOL Ltd. (Gon-emon Kurihara, President) announced a new correlative microscope system, "Mixcroscopy", that combines optical microscopy and scanning electron microscopy. The new system is available from now on.
18.04.2013 JEOL Introduces New Zero Boil Off Magnet for NMR Systems
JEOL (Akishima City, Tokyo) has developed a new Nuclear Magnetic Resonance (NMR) super conducting magnet that operates on a minimum amount of liquid helium. The new NMR system has been be announced at the 54th Experimental Nuclear Magnetic Resonance Conference (ENC), the largest NMR conference in the US.
08.04.2013 JMS-100 GCV (AccuTOFGCV) - Demo and exhibition unit providing many ionisation options
This JMS-100 GCv unit (AccuTOFGCv) is a showroom model from JEOL's application lab.
09.07.2011 JEOL Q-SEM Series – Analytical Scanning Electron Microscopes
The scanning electron microscopes in the Q-SEM Series offer outstanding performance and ease of use. They were designed to meet the sophisticated quality assurance requirements both of the academic and industrial world.
08.07.2011 JEOL Spiral-TOF: Patented ion optics with the highest mass resolution available in the world
With the new Spiral TOF, JEOL offers a MALDI-TOF mass spectrometer that stands out with its extra-long spiral flight path of 17 m. In the spiral TOF the ions circulate up to 8 times in the device.
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Exhibition Dates
WAVLD 2013
05.06. - 08.06.2013 in Berlin, GermanyScandem 2013
10.06. - 14.06.2013 in Copenhagen, DenmarkMeeting of the Nordic Microscopy Society
EMLC 2013
25.06. - 27.06.2013 in Dresden, GermanyEuropean Mask and Lithography Conference. Hilton Hotel, Dresden.
© 2011 JEOL (Germany) GmbH. All rights reserved. Implementation: K-3D Graphic